Simultaneous wideband extraction algorithms for complex permittivity (ε) and magnetic permeability (μ).

Nicolson-Ross-Weir (NRW): Standard transmission/reflection method for scattering parameters.
Non-Iterative Method: Fast, stable permittivity extraction that completely eliminates phase-unwrapping errors.
NIST Iterative Root Finder: High-precision iterative framework optimized for thick samples and low-loss materials.
Short Circuit Line (SCL) 1-Port: Dedicated reflection-only measurement model for tight spaces or metallic backings.

Mathematical compensation for hardware tolerances, sample placement, and calibration boundaries.

Transmission Line Support: Coaxial lines, rectangular rectangular waveguides, and free-space propagation modes.
Automated Air-Gap Correction: Analytical compensation for sample-to-holder boundary tolerances.
Analytical Port Extensions: Phase shifting to mathematically adjust reference measurement planes.
Touchstone Fixture De-embedding: Dynamic subtraction of test fixtures using standard (.s2p) data files.

High-precision extraction modules tailored for narrow-band, single-frequency high-Q systems.

Resonant Cavity Perturbation: Precise extraction for small solid dielectric samples based on frequency shift and Q-factor change.
Open-Ended Coaxial Probe: Mathematical models optimized for liquid, semi-solid, and biological material characterization.
Q-Factor Processing: Advanced geometric peak-fitting engine for high-loss and low-loss resonance lines.

Direct parsing of plane-wave Shielding Effectiveness parameters from measured transmission and reflection S-values.

Total Shielding Effectiveness (SE): Overall attenuation calculation expressed clearly in decibels (dB).
Absorption Loss Analysis: Isolation of energy dissipation inside the physical material matrix.
Reflection Loss Analysis: Computation of raw return losses at the front material boundary.
Multiple Reflection Correction: Full compensation for internal resonance inside thin-film shields.

Interactive rendering of complex dielectric, magnetic, and conductive parameters across the RF spectrum.

Permittivity Profiles: Real (ε') and Imaginary (ε'') components plotted over custom sweeps.
Permeability Profiles: Real (μ') and Imaginary (μ'') magnetic attributes.
Dielectric Conductivity (σ): Calculated frequency-dependent loss characteristics.
Loss Tangents: Dedicated curves for Dielectric (tan δ_e) and Magnetic (tan δ_m) dissipation.

Accelerate laboratory data extraction pipelines with bulk actions and publication-ready outputs.

Batch Queue Processing: Drag-and-drop workflow to convert folders of raw VNA files simultaneously.
Excel (.xlsx) Export: Well-structured spreadsheets containing fully calculated values alongside raw data arrays.
Automated Report Layouts: Export directly to formatted sheets with embedded high-resolution vector plots.
Measurement Sessions: Save complete de-embedding states and data lists via native (.emms) project archives.

Category	Supported Technical Specifications
VNA Compatibility	Processes Touchstone data files from Keysight (PNA, ENA), Rohde & Schwarz (ZNB), Anritsu (ShockLine), Copper Mountain, and portable pocket VNAs.
Input Formats	Standard 1-port and 2-port scattering parameter data files (`.s1p`, `.s2p`) with flexible magnitude/phase format auto-detection.
Output Formats	Microsoft Excel spreadsheets (`.xlsx`), Comma-Separated Values (`.csv`), high-resolution plot images (PNG), and native measurement sessions (`.emms`).
System Requirements	Windows 10 / 11 (64-bit architecture). Run fully local with complete support for air-gapped, secure lab isolation environments.

Uncover Material Properties with Confidence.

EM Material Analyzer: RF & Microwave Material Characterization Software